Accelerating Test, Validation and Debug of High Speed Serial Interfaces (eBook)
XII, 194 Seiten
Springer Netherlands (Verlag)
978-90-481-9398-1 (ISBN)
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.
Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
Yongquan Fan is a Senior Test Engineer in the High Performance Analog group at Texas Instruments. He had been a Senior Staff Engineer in the Storage Peripheral Group at LSI Corporation from 2003-2008. From 1991 to 2000, he worked for Sichuan Changhong Electronic Incorporation, China. Yongquan Fan obtained his Ph.D and MENG degree from McGill University, Canada and his BS from Beijing University of Aeronautics and Astronautics, China, all in Electrical Engineering.
Zeljko Zilic received his Ph. D. and M. Sc. from the University of Toronto, and his B. Eng. from University of Zagreb, Croatia. From 1996 till 1997 he worked for Lucent Microelectronics. He joined McGill University in 1998, where he is now an Associate Professor. Prof. Zilic has used a sabbatical leave in 2004/2005 to work with ST Microelectronics in Ottawa. He has received two Best Paper Awards and several honorary mentions from international conferences, as well as a national teaching award in Canada.
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
Yongquan Fan is a Senior Test Engineer in the High Performance Analog group at Texas Instruments. He had been a Senior Staff Engineer in the Storage Peripheral Group at LSI Corporation from 2003~2008. From 1991 to 2000, he worked for Sichuan Changhong Electronic Incorporation, China. Yongquan Fan obtained his Ph.D and MENG degree from McGill University, Canada and his BS from Beijing University of Aeronautics and Astronautics, China, all in Electrical Engineering. Zeljko Zilic received his Ph. D. and M. Sc. from the University of Toronto, and his B. Eng. from University of Zagreb, Croatia. From 1996 till 1997 he worked for Lucent Microelectronics. He joined McGill University in 1998, where he is now an Associate Professor. Prof. Zilic has used a sabbatical leave in 2004/2005 to work with ST Microelectronics in Ottawa. He has received two Best Paper Awards and several honorary mentions from international conferences, as well as a national teaching award in Canada.
Acknowledgments 6
Table of Contents 8
1 Introduction 12
1.1 Motivation 12
1.2 Contributions 19
1.3 Overview of the Book 20
2 Background 22
2.1 High-Speed Serial Communication 22
2.2 Timing Jitte 32
2.3 Amplitude Noise 39
3 Accelerating Receiver Jitter Tolerance Testing on ATE 47
3.1 Introduction 48
3.2 Jitter Test Signal Generation 61
3.3 Receiver Bit Error Monitoring 75
3.4 Jitter Tolerance Extrapolation 78
3.5 Other Applications of the New Method 92
4 Transmitter Jitter Extractions on ATE 96
4.1 Introduction 96
4.2. Test Setup for Data Acquisition 99
4.3. Jitter Extraction 106
4.4 Experimental Results 121
4.5 Summary 127
5 Testing HSSIs with or without ATE Instruments 129
5.1 DFT in HSSIs 130
5.2 FPGA-based Bit Error Detection 133
5.3 Loopback Testing with Jitter Injection 138
5.4 A Versatile HSSI Testing Scheme 145
6 BER Testing Under Noise 156
6.1 AWG. Generation Overview 156
6.2 Our Implementation 162
6.3 Baseband Transmission Testing 176
6.4 Advantages of Our AWGN Generator 183
7 Conclusions 186
Reference 189
Index 199
Erscheint lt. Verlag | 20.10.2010 |
---|---|
Zusatzinfo | IX, 100 p. |
Verlagsort | Dordrecht |
Sprache | englisch |
Themenwelt | Mathematik / Informatik ► Informatik ► Software Entwicklung |
Mathematik / Informatik ► Informatik ► Theorie / Studium | |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Nachrichtentechnik | |
Schlagworte | Bit error rate testing • Circuit Desnign • Debugging • Electronic Design Automation • Electronic Testing • High-speed serial interfaces • Jitter injection and characterization • Mixed-signal testing • Verification & Validation • Verification & Validation |
ISBN-10 | 90-481-9398-2 / 9048193982 |
ISBN-13 | 978-90-481-9398-1 / 9789048193981 |
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